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Filters: Author is Dahiwale, S. and Keyword is Poole-Frenkel emission  [Clear All Filters]
2010
P. Laha, Panda, A. B., Dahiwale, S., Date, K. S., Patil, K. R., Barhai, P. K., Das, A. K., Banerjee, I., and Mahapatra, S. K., “Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure”, Thin Solid Films, vol. 519, no. 5, pp. 1530-1535, 2010.