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Filters: Author is Dahiwale, S. and Keyword is Al2O3  [Clear All Filters]
2010
P. Laha, Panda, A. B., Dahiwale, S., Date, K. S., Patil, K. R., Barhai, P. K., Das, A. K., Banerjee, I., and Mahapatra, S. K., “Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure”, Thin Solid Films, vol. 519, no. 5, pp. 1530-1535, 2010.