New approach towards imaging lambda-DNA using scanning tunneling microscopy/spectroscopy (STM/STS)
| Title | New approach towards imaging lambda-DNA using scanning tunneling microscopy/spectroscopy (STM/STS) |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Dey, S, Pethkar, S, Adyanthaya, SD, Sastry, M, Dharmadhikari, CV |
| Journal | Bulletin of Materials Science |
| Volume | 31 |
| Issue | 3 |
| Pagination | 309-312 |
| Date Published | JUN |
| ISSN | 0250-4707 |
| Keywords | DNA, Langmuir Blodget technique, Scanning tunneling microscopy, silanization |
| Abstract | A new methodology to anchor A-DNA to silanized n-Si(111) surface using Langmuir Blodget trough was developed. The n-Si (111) was silanized by treating it with low molecular weight octyltrichlorosilane in toluene. Scanning tunneling microscopy (STM) image of lambda-DNA on octyltrichlorosilane deposited Si substrate shows areas exhibiting arrayed structures of 700 nm length and 40 nm spacing. Scanning tunneling spectroscopy (STS) at different stages depict a broad distribution of defect states in the bandgap region of n-Si(111) which presumably facilitates tunneling through otherwise insulating DNA layer. |
| DOI | 10.1007/s12034-008-0049-6 |
| Type of Journal (Indian or Foreign) | Foreign |
| Impact Factor (IF) | 0.944 |
Divison category:
Physical and Materials Chemistry
